Quanti di scienza: distribuzione di pareto

Il mio libro

L'universo dei numeri i numeri dell'Universo. Editrice Aracne

Link

Recensione sul blog scientifico Gravita' zero

Link

Recensione sul blog Amolamatematica

Link

Recensione sul blog Matematicamente

Link

Recensione sul blog MaddMaths

Link

Presentazione del libro - 9 Giugno 2012 Avezzano

Link

Intervista Antenna2 TG del 16 Giugno 2012

Link

Recensione su Stabiachannel.it

Link

Recensione sul Gazzettino Vesuviano

Link

Annuncio sul giornale Il Centro

link

Dove acquistare il libro online

IBS

Amazon it

BOL

Ciao

Libreria Universitaria

Hoepli

Unilibro

Amazon.com

Pubblicazioni scientifiche

·
Felice Russo et al., Investigation on capillaries filled with liquid scintillator for high resolution particle tracking, Nuclear Intruments and Methods in Physics Research, A30, 1991

·
Felice Russo et al., Plasma Damage Correlation of Predatorâ Data with 0.5 um DRAM Device Scribe Structures, TI Technical Activity Report, 1998

·
Felice Russo et al., Effect of HCl/HBr purity on polysilicon etching, Texas Inst. European Technical Conference, Nice, March 1995

·
Felice Russo et al., High Planarization degree by Metal-Filled Interconnecting Grooves, TI Tecnhical Activity Report , March 1996

·
Felice Russo, Plasma Etching Traning Course, Texas Instruments Internal communication, May 1995.

·
Felice Russo, LDD process integration semplification for DRAM, TI Technical Activity Report, April 1995

·
Felice Russo, Evolution of DRAM cell technology, TI Technical Activity Report, May 1998

·
Felice Russo et al., Pipeline defects characterization and reduction, TI Technical Activity Report, Sept. 1997

·
Felice Russo et al., Semiconductor Device Modeling using a Neural Network, TI Technical Journal, Jan-March 1999

·
Felice Russo et al., Moat Etch Impact on Flash EPROM Technology, TI Technical Journal, Jan-March 1999.

·
Felice Russo, Role of device scaling in yield modeling, Micron internal publication 2005

·
Felice Russo, Fili di vetro per indagare gli atomi, Scienza & Vita, Dic. 1990

·
Felice Russo, Radiazione di Sincrotrone, Scienza & Vita, Dic. 1989

·
Felice Russo, Come le radiazioni aiutano il restauro, Scienza & Vita, Dic. 1989

·
Felice Russo, La termoluminescenza, Scienza & Vita, Dic. 1988

·
Felice Russo, Automi cellulari, List, Dic. 1988

·
Felice Russo, On circular primes, Mathematical Spectrum letter to editor.

·
Felice Russo and Fernanda Irrera, Off-stechiometric silicon oxides for applications in low-voltage flash memories, 11th Biennual Conference on Insulating films on semiconductors, 16-19 June 1999, Erlangen/Kloster Banz Germany.

·
Felice Russo et al., Stress Induced VIA Voiding in a 130 nm CMOS Imager Process IEEE Transactions on Device and Materials Reliability, March 2010, V10, pag. 100-107

·
Felice Russo et al, Prediction of breakdown in ultra-thin SiO2 films with fractal distribution of traps J. Appl. Phys. 2009, 106, 063768 (2009)

·
Felice Russo et al., Low-k dielectrics for trench isolation in nanoscaled CMOS imagers Journal of Vacuum Science Technology B, 27 (1) (2009), 517-20

·
Felice Russo et al., STI with air-gaps in nanoscaled CMOS imagers Workshop on Dielectrics in Microelectronics (WODIM), Berlino, 2008

·
Felice Russo et al., T-shaped shallow trench isolation with an unfilled floating void Solid-State Electronics 52 (2008), 1188-1192

·
Felice Russo and Fernanda Irrera, Off-stochiometric
silicon oxides for applications in low-voltage flash memories Microelectronic Engineering, 48 (1999) 423

·
Felice Russo and Fernanda Irrera, Silicon rich oxides in the gate stack of non-volatile memories Proc. of INFOS Erlangen (D) 1999

·
Felice Russo and Fernanda Irrera, Enhanced injection in n++-poly/SiOx/SiO2/p-sub MOS capacitors for low-voltage non-volatile memory applications: experiment IEEE-Trans. Electron Devices 46 (1999) 2315

·
Felice Russo, L’universo dei numeri I numeri dell’universo, Editore Aracne, 2011, pag. 508

·
Felice Russo, A set of new Smarandache functions, sequences and conjectures in number theory, American Research Press, Lupton USA, 2000

·
Felice Russo and Paolo Organtini, Forecast of CMOS imagers yield learning by the Gompertz model, IEEE Transaction on semicondcutor manufacturing, Vol. 26, Issue 3 Aug. 2013. Already published on Micron Technical Journal Vol. 3 No. 2 Aug. 2012

·
Felice Russo et al, Proximity Gettering of Slow Diffuser Contaminants in CMOS Image Sensors, Micron Technical Journal Aug2013

·
Felice Russo et al., Proximity Gettering of Slow Diffuser Contaminants in CMOS Image Sensors, Proceedings of GADEST 2013, Solid State Phenomena 2013

·
Felice Russo et al, Proximity Gettering of Slow Diffuser Contaminants in CMOS Image Sensors, Solid State Electronics 91 (2014) 91-99

·
Felice Russo, The Smarandache P and S persistence of a prime, Scientia Magna Vol.1 (2006) No. 2, 71-75

·
Felice Russo and Stefano Russo, A Pattern Recognition Tool for Automatic Etch Process Quality Check, Advanced Semiconductor Manufacturing Conference
, 2008 ASMC IEEE/SEMI